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Authors:
Riedl, Martin; Schuster, Johann; Siegle, Markus; Blum, M.; Schiller, F. 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Dependability model transformation 
Subtitle:
a stochastic process algebra semantics for ZuverSicht models 
Collection editors:
Ale, Ben J. M.; Papazoglou, Ioannis A.; Zio, Enrico 
Title of conference publication:
Reliability, Risk and Safety 
Subtitle of conference publication:
Back to the Future ; ESREL (European Safety and Reliability) ... annual conference, Island of Rhodes 
Conference title:
European Safety & Reliability Annual Conference (2010, Rhodos) 
Venue:
Rhodes 
Year of conference:
2010 
Date of conference beginning:
05.09.2010 
Date of conference ending:
09.09.2010 
Place of publication:
London 
Publisher:
CRC Press 
Year:
2010 
Pages from - to:
932-940 
Language:
Englisch 
ISBN:
0415604273 ; 978-0415604277 
Department:
Fakultät für Informatik 
Institute:
INF 3 - Institut für Technische Informatik 
Chair:
Siegle, Markus 
Open Access yes or no?:
Nein / No