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Authors:
Johannes Weber 
Document type:
Dissertation / Thesis 
Title:
Pulsed High Current Characterization of Highly Integrated Circuits and Systems 
Advisor:
Maurer, Linus Prof. Dr. techn. 
Referee:
Maurer, Linus Prof. Dr. techn. ; Weigel, Robert Prof. Dr.-Ing. Dr.-Ing. habil. 
Date oral examination:
25.07.2019 
Publishing institution:
Universität der Bundeswehr München 
Publication date:
12.11.2019 
Year:
2019 
Pages (Book):
122 
Language:
Englisch 
Keywords:
ESD, CDM, CC-TLP, rise time, slew rate 
Abstract:
The Charged Device Model (CDM) describes the primary cause for Electrostatic Discharge (ESD) failures in manufacturing and automatic handling. The CDM test method is the standardized procedure used worldwide to characterize the susceptibility of a device to damage from ESD under CDM conditions. Prevailing trends in the semiconductor industry like technology scaling towards the deep sub-10-nm regime or the steady increase in data rates in high-speed IOs (> 50Gbps) have come at the expense of de...    »
 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik 
Chair:
Prof. Dr. techn. Linus Maurer 
Open Access yes or no?:
Ja / Yes