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Authors:
Bergmaier, Andreas; Dollinger, Günther; Faestermann, Thomas; Frey, C. M.; Dworschak, W.; Ehrhardt, H. 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
Elemental composition of thin c-BN layers 
Journal:
Diamond and Related Materials 
Volume:
Issue:
Year:
1995 
Pages from - to:
478-481 
Language:
Englisch 
Keywords:
BN phases ; Cubic boron nitride ; Elastic recoil detection ; High resolution depth profiling 
Abstract:
Some experiments on the growth of cubic boron nitride (c-BN) show that the content of c-BN in BN films depends on the film thickness. Non-cubic phases, such as amorphous and hexagonal BN, can be identified, particularly near the substrate. To understand these phase variations, elemental depth profiles of thin BN films were measured by high resolution elastic recoil detection (ERD). BN films have been prepared by r.f. glow discharge (r. 
ISSN:
0925-9635 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No