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Authors:
Keeble, David J.; MacKie, R. A.; Egger, Werner; Löwe, Benjamin; Pikart, P.; Hugenschmidt, Christoph; Jackson, T. J. 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
Identification of vacancy defects in a thin film perovskite oxide 
Journal:
Physical Review B 
Volume:
81 
Issue:
Year:
2010 
Language:
Englisch 
Abstract:
Vacancies are the dominant point defects in perovskite oxides, however, detecting and identifying the nature of vacancy defects in thin films remains challenging. This can be achieved using electron-beam methods but concentrations of several percent are required. Here we use a high-flux positron beam, providing high statistics positron lifetime measurements, to identify vacancies in laser ablated SrTiO3 on SrTiO3. The method is capable of subparts per million sensitivity and when combined with d...    »
 
ISSN:
1098-0121 
Article ID:
064102 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No