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Document type:
Konferenzbeitrag / Conference Paper
Title:
An extended critical path method for complex assembly lines
Collection title:
IIE Annual Conference. Proceedings
Title of conference publication:
62nd Annual Conference and Expo of the Institute of Industrial Engineers 2012
Subtitle of conference publication:
Proceedings of a meeting held 19-23 May 2012, Orlando, Florida, USA
Organizer (entity):
Institute of Industrial and Systems Engineers (IISE)
Conference title:
IIE Annual Conference and Expo (62., 2012, Orlando, FL)
Venue:
Orlando, Fla
Year of conference:
2012
Date of conference beginning:
19.05.2013
Date of conference ending:
23.05.2013
Publishing institution:
Institute of Industrial Engineers ( IIE )
Year:
2012
Language:
Englisch
ISBN:
9781632663078
Department:
Fakultät für Informatik
Institute:
INF 3 - Institut für Technische Informatik
Chair:
Rose, Oliver
Open Access yes or no?:
Nein / No
BibTeX