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Document type:
Konferenzbeitrag / Conference Paper
Title:
Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using a modified laser interferometry technique
Title of conference publication:
European Symposium, on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
Subtitle of conference publication:
Dresden, Germany; 2.10.2000 – 6.10.2000
Conference title:
European Symposium, on Reliability of Electron Devices, Failure Physics and Analysis (2000, Dresden)
Venue:
Dresden
Year of conference:
2000
Date of conference beginning:
02.10.2000
Date of conference ending:
06.10.2000
Year:
2000
Language:
Englisch
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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