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Authors:
Alsioufy, Adnan; Hirler, Alexander; Lehndorff, Thomas; Sulima, Torsten; Lochner, Helmut; Simon, Stefan; Siddabathula, Mahesh; Wiatr, Maciej; Hansch, Walter 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
Technology Black Box 
Subtitle:
A Pioneering Tool for Semiconductor Technology Development in the Automotive Industry 
Place of publication:
Neubiberg 
Publishing institution:
Universität der Bundeswehr München 
Year:
2020 
Pages (Book):
Language:
Englisch 
Subject:
Kraftfahrzeugindustrie ; Halbleitertechnologie ; Zuverlässigkeit ; Technikbewertung ; Softwarewerkzeug 
Abstract:
During last years the automotive industry is driving substantial changes in the semiconductor value chain, seeking for specialized products tightly bounded to their application space. Therefore even if the Automotive Electronics Council (AEC) states different "grades" for the compliance of microelectronics chips, under different uniform environmental temperature stress, still an agreement on actual Mission Profiles (MP) is missing. The MP remains nowadays customer specific, therefore the assessm...    »
 
DDC notation:
629.272 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 2 - Institut für Physik 
Chair:
Hansch, Walter 
Open Access yes or no?:
Ja / Yes