Login
Document type:
Konferenzbeitrag / Conference Paper
Title:
Impact of Device Scaling on Phase Noise in SiGe HBTs UWB VCOs
Title of conference publication:
2006 IEEE MTT-S International Microwave Symposium Digest
Conference title:
IEEE MTT-S International Microwave Symposium Digest (2006, San Francisco, CA)
Venue:
San Francisco, CA, USA
Year of conference:
2006
Date of conference beginning:
11.06.2006
Date of conference ending:
16.06.2006
Publisher:
IEEE
Year:
2006
Language:
Englisch
ISBN:
0-7803-9541-7
Open Access yes or no?:
Nein / No
BibTeX