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Document type:
Konferenzbeitrag / Conference Paper
Title:
Impact of Device Scaling on VCOs Phase Noise in SiGe HBTs
Title of conference publication:
2005 International Semiconductor Device Research Symposium
Conference title:
International Semiconductor Device Research Symposium (2005, Bethesda, MD)
Venue:
Bethesda, MD, USA
Year of conference:
2005
Date of conference beginning:
07.12.2005
Date of conference ending:
09.12.2005
Publisher:
IEEE
Year:
2005
Language:
Englisch
ISBN:
1-4244-0083-X
Open Access yes or no?:
Nein / No
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