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Authors:
Lehndorff, Thomas; Abelein, Ulrich; Alsioufy, Adnan; Hirler, Alexander; Sulima, Torsten; Simon, Stefan; Lochner, Helmut; Hansch, Walter 
Document type:
Monografie / Monograph 
Title:
Extended lifetime qualification concepts for automotive semiconductor components 
Place of publication:
Neubiberg 
Publishing institution:
Universität der Bundeswehr München 
Year:
2020 
Pages (Book):
Language:
Englisch 
Subject:
Kraftfahrzeugindustrie ; Autonomes Fahrzeug ; Elektrofahrzeug ; Halbleitertechnologie ; Zuverlässigkeit ; Lebensdauer ; Technikbewertung 
Abstract:
Current automotive megatrends electro mobility, digitalization and autonomous driving lead to more demanding reliability requirements for automotive semiconductors. The most significant change applies to the operating time, which increases at least by a factor four. In this work, a typical new mission profile is used to highlight that the established qualification procedure using standardized stress test conditions, the AEC-Q100, is not sufficient to proof fulfillment of these new life-cycle req...    »
 
DDC notation:
629.272 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 2 - Institut für Physik 
Chair:
Hansch, Walter 
Open Access yes or no?:
Ja / Yes