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Autoren:
Kähler, Christian J.; McKenna, R.; Scholz, U. 
Dokumenttyp:
Konferenzbeitrag / Conference Paper 
Titel:
Wall-shear-stress measurements at moderate Re-numbers with single pixel resolution using long distance $\mu$-PIV - an accuracy assessment 
Titel Konferenzpublikation:
6th International Symposium on Particle Image Velocimetry, Pasadena, California, September 21-23 
Konferenztitel:
International Symposium on Particle Image Velocimetry (6., 2005, Pasadena, Calif.) 
Tagungsort:
Pasadena, Calif. 
Jahr der Konferenz:
2005 
Datum Beginn der Konferenz:
21.09.2005 
Datum Ende der Konferenz:
23.09.2005 
Jahr:
2005 
Sprache:
Englisch 
Abstract:
A large-format, digital, long-distance micro Particle Image Velocimetry system (µPIV) has been applied, to measure the wall-shear-stress and the logarithmic region of a canonical boundary layer flow along a flat plate, non-intrusively with high accuracy and spatial resolution. The fundamental aim was the accurate determination of the two universal constants k and B of the logarithmic law-of-the-wall for different Reynolds numbers. This is of fundamental interest in order to provide...    »