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Authors:
Kögel, Gottfried; Triftshäuser, Werner; Sperr, Peter; Uhlmann, K.; Britton, David T.; Willutzki, Paul; Steindl, R.; Junker, W.; Zecca, A.; Brusa, R. S.; Duarte-Naia, M. P.; Karwasz, G. P.; Paridaens, J.; Piazza, A. 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
The München scanning positron microscope 
Journal:
Applied Surface Science 
Volume:
116 
Year:
1997 
Pages from - to:
108-113 
Language:
Englisch 
Abstract:
For the first time a scanning positron microscope (SPM) using a pulsed positron beam for the nondestructive, three-dimensionally resolved investigation of defect distributions has been constructed. A positron beam with variable energy from 0.5 to 30 keV, with a spot diameter of 1 μm or below, can be scanned over an area of 0.6 × 0.6 mm2. Beam pulsing enables positron lifetime studies with a time resolution of 200 ps FWHM. The beam is formed by double stage stochastic cooling (moderation) of the...    »
 
ISSN:
0169-4332 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No