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Authors:
Simon, Sebastian; Bhat, Deeksha; Rath, Alexander; Kirscher, Jérôme; Maurer, Linus
Document type:
Konferenzbeitrag / Conference Paper
Title:
Coverage-driven mised-signal verification of smart power ICs in a UVM environment
Conference title:
IEEE European Test Symposium (22., 2017, Limassol)
Conference title:
22nd IEEE European Test Symposium (ETS)
Venue:
Limassol, Cyprus
Year of conference:
2017
Date of conference beginning:
22.05.2017
Date of conference ending:
26.05.2017
Publisher:
IEEE
Year:
2017
Pages from - to:
1-6
Language:
Englisch
Abstract:
The complexity of integrated circuits is continuously increasing, leading to a growing demand for methodologies that offer comprehensive mixed-signal verification concepts. However, compared to the highly automated verification methodologies in the digital domain, pre-silicon verification in the analog domain usually implies a substantial amount of manual work and computational effort. In order to meet the rising challenges, various attempts were made to extend well-established approaches from t...     »
ISBN:
978-1-5090-5457-2
ISSN:
1558-1780
DOI:
10.1109/ETS.2017.7968237
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
Chair:
Maurer, Linus
Open Access yes or no?:
Ja / Yes
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