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- Authors:
- Weber, Johannes; Kaschani, Karim T.; Gieser, Horst; Wolf, Heinrich; Maurer, Linus; Famulok, Nicolai; Moser, Reinhard; Rajagopal, Krishna; Sellmayer, Michael; Sharma, Anmol; Tamm, Heiko
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Correlation study of different CDM testers and CC-TLP
- Conference title:
- Electrical Overstress/Electrostatic Discharge Symposium (39., 2017, Tucson, AZ)
- Conference title:
- 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
- Venue:
- Tucson, AZ, USA
- Year of conference:
- 2017
- Date of conference beginning:
- 10.09.2017
- Date of conference ending:
- 14.09.2017
- Publishing institution:
- IEEE
- Year:
- 2017
- Pages from - to:
- 1-10
- Language:
- Englisch
- Abstract:
- This paper analyzes the correlation between test results of three different CDM testers and corresponding results of Capacitively Coupled Transmission Line Pulsing (CC-TLP). Furthermore, it discusses the significance of the current slew rate as an additional failure threshold and the reasons for a poor reproducibility of CDM failures.
- ISBN:
- 978-1-58537-293-5
- DOI:
- 10.23919/EOSESD.2017.8073446
- Department:
- Fakultät für Elektrotechnik und Informationstechnik
- Institute:
- EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
- Chair:
- Maurer, Linus
- Open Access yes or no?:
- Ja / Yes
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