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- Authors:
- Koch, Sebastian; Gossner, Harald; Gieser, Horst; Maurer, Linus
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- ESD performance evaluation of powered high-speed interfaces
- Title of conference publication:
- 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
- Conference title:
- IEEE International Symposium on Electromagnetic Compatibility (2015, Dresden)
- Venue:
- Dresden, Germany
- Year of conference:
- 2015
- Date of conference beginning:
- 16.08.2015
- Date of conference ending:
- 22.08.2015
- Publishing institution:
- IEEE
- Year:
- 2015
- Pages from - to:
- 1101-1105
- Language:
- Englisch
- Abstract:
- An approach towards evaluating the ESD performance of high-speed interfaces is presented. By applying ESD stress to powered USB 3.0 interfaces the propagation of very short ESD pulses is investigated. Soft failures caused by TLP stress are put into relation to hard failure thresholds of the unpowered devices as well as soft failures induced by IEC 61000-4-2 pulses.
- ISBN:
- 978-1-4799-6616-5
- DOI:
- 10.1109/ISEMC.2015.7256322
- Department:
- Fakultät für Elektrotechnik und Informationstechnik
- Institute:
- EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
- Chair:
- Maurer, Linus
- Open Access yes or no?:
- Ja / Yes
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