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- Authors:
- Fürböck, Christoph; Esmark, Kai; Litzenberger, Martin; Pogany, Dionýz; Groos, Gerhard; Zelsacher, R.; Stecher, M.; Gornik, Erich
- Document type:
- Zeitschriftenartikel / Journal Article
- Title:
- Thermal and free carrier concentration mapping during ESD event in smart power ESD protection devices using a modified laser interferometry technique
- Journal:
- Microelectronics and Reliability
- Volume:
- 40
- Issue:
- 8-10
- Year:
- 2000
- Pages from - to:
- 1365-1370
- Language:
- Englisch
- DOI:
- 10.1016/S0026-2714(00)00144-X
- URL:
- https://doi.org/10.1016/S0026-2714(00)00144-X
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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