Login
- Authors:
- Bychikhin, Sergey; Litzenberger, Martin; Pichler, R.; Pogany, Dionýz; Gornik, Erich; Groos, Gerhard; Stecher, Matthias
- Document type:
- Zeitschriftenartikel / Journal Article
- Title:
- Thermal and free carrier laser interferometric mapping and failure analysis an "anti"-serially connected npn transistor ESD protection structure
- Journal:
- Microelectronics and Reliability
- Volume:
- 41
- Issue:
- 9-10
- Year:
- 2001
- Pages from - to:
- 1501-1506
- Language:
- Englisch
- DOI:
- 10.1016/S0026-2714(01)00152-4
- URL:
- http://dx.doi.org/10.1016/S0026-2714(01)00152-4
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
BibTeX