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- Authors:
- Blaho, Matej; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Groos, Gerhard; Stecher, Matthias
- Document type:
- Zeitschriftenartikel / Journal Article
- Title:
- Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method
- Journal:
- Microelectronics Reliability
- Volume:
- 43
- Issue:
- 4
- Year:
- 2003
- Pages from - to:
- 545-548
- Language:
- Englisch
- DOI:
- 10.1016/S0026-2714(03)00021-0
- URL:
- https://doi.org/10.1016/S0026-2714(03)00021-0
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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