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- Authors:
- Helmut, Dennis; Wachutka, Gerhard K. M.; Groos, Gerhard
- Document type:
- Zeitschriftenartikel / Journal Article
- Title:
- Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP)
- Journal:
- Microelectronics Reliability
- Issue:
- 76–77
- Year:
- 2017
- Pages from - to:
- 97–101
- Language:
- Englisch
- Keywords:
- Latent defects ; Latent failure ; Defect generation ; Transient characterisation ; Transmission line pulsing ; TLP ; SMD capacitors ; Dielectric breakdown ; Electrical overstress ; EOS
- DOI:
- 10.1016/j.microrel.2017.06.076
- URL:
- https://doi.org/10.1016/j.microrel.2017.06.076
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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