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- Authors:
- Fürböck, Christoph; Esmark, Kai; Litzenberger, Martin; Pogany, Dionýz; Groos, Gerhard; Zelsacher, R.; Stecher, Matthias; Gornik, Erich
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using a modified laser interferometry technique
- Title of conference publication:
- European Symposium, on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
- Subtitle of conference publication:
- Dresden, Germany; 2.10.2000 – 6.10.2000
- Conference title:
- European Symposium, on Reliability of Electron Devices, Failure Physics and Analysis (2000, Dresden)
- Venue:
- Dresden
- Year of conference:
- 2000
- Date of conference beginning:
- 02.10.2000
- Date of conference ending:
- 06.10.2000
- Year:
- 2000
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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