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- Authors:
- Esmark, Kai; Fürböck, Christoph; Gossner, Harald; Groos, Gerhard; Litzenberger, Martin; Pogany, Dionýz; Zelsacher, R.; Stecher, Matthias; Gornik, Erich
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Simulation and experimental study of temperature distribution during ESD stress in smart-power technology ESD protection structures
- Title of conference publication:
- 38th Annual 2000 IEEE International Reliability Physics Symposium Proceedings
- Conference title:
- Annual IEEE International Reliability Physics Symposium (38., 2000, San Jose, CA)
- Conference title:
- IRPS 2000
- Venue:
- San Jose, CA
- Year of conference:
- 2000
- Date of conference beginning:
- 10.04.2000
- Date of conference ending:
- 13.04.2000
- Publisher:
- IEEE
- Year:
- 2000
- Pages from - to:
- 304 – 309
- Language:
- Englisch
- ISBN:
- 0-7803-5860-0
- DOI:
- 10.1109/RELPHY.2000.843931
- URL:
- https://doi.org/10.1109/RELPHY.2000.843931
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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