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Document type:
Konferenzbeitrag / Conference Paper
Title:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures
Title of conference publication:
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
Subtitle of conference publication:
Bourdeaux, France; 01.11.2001 - 05.11.2001
Conference title:
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (2001, Bourdeaux)
Venue:
Bourdeaux, France
Year of conference:
2001
Date of conference beginning:
01.11.2001
Date of conference ending:
05.11.2001
Year:
2001
Language:
Englisch
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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