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- Authors:
- Bychikhin, Sergey; Litzenberger, Martin; Pichler, Rudolf; Pogany, Dionýz; Gornik, Erich; Groos, Gerhard; Stecher, Matthias
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures
- Title of conference publication:
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
- Subtitle of conference publication:
- Bourdeaux, France; 01.11.2001 - 05.11.2001
- Conference title:
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (2001, Bourdeaux)
- Venue:
- Bourdeaux, France
- Year of conference:
- 2001
- Date of conference beginning:
- 01.11.2001
- Date of conference ending:
- 05.11.2001
- Year:
- 2001
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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