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- Authors:
- Blaho, Matej; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Groos, Gerhard; Stecher, Matthias
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Investigation of the internal behavior of a vertical DMOS transistor under short duration, high current stress by an optical thermal mapping method
- Title of conference publication:
- Proceedings of the 6th International Seminar on Power Semiconductors (ISPS), Prague 2002
- Conference title:
- International Seminar on Power Semiconductors (6., 2002, Prag)
- Venue:
- Prague, Czech Republic
- Year of conference:
- 2002
- Date of conference beginning:
- 02.09.2002
- Date of conference ending:
- 04.09.2002
- Year:
- 2002
- Pages from - to:
- 63-67
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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