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- Authors:
- Pogany, Dionýz; Bychikhin, Sergey; Kuzmík, Ján; Dubec, Viktor; Jensen, Nils; Denison, Marie; Groos, Gerhard; Stecher, Matthias; Gornik, Erich
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Thermal distribution during destructive pulses in ESD protection devices using a single-shot, two-dimensional interferometric method
- Title of conference publication:
- Digest. International Electron Devices Meeting
- Subtitle of conference publication:
- 8-11 Dec. 2002
- Conference title:
- International Electron Devices Meeting (2002, San Francisco, CA)
- Conference title:
- IEDM 2002
- Venue:
- San Francisco, CA
- Year of conference:
- 2002
- Date of conference beginning:
- 08.12.2002
- Date of conference ending:
- 11.12.2002
- Place of publication:
- Piscataway
- Publisher:
- IEEE
- Year:
- 2002
- Pages from - to:
- 345-348
- Language:
- Englisch
- ISBN:
- 0-7803-7462-2
- DOI:
- 10.1109/IEDM.2002.1175849
- URL:
- https://doi.org/10.1109/IEDM.2002.1175849
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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