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- Authors:
- Dubec, Viktor; Bychikhin, Sergey; Blaho, Matej; Heer, Michael; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Jensen, Nils; Stecher, Matthias; Groos, Gerhard
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Multiple-time-instant 2D thermal mapping during a single ESD event
- Conference title:
- European Symposium Reliability of Electron Devices, Failure Physics and Analysis (15., 2004, Zürich)
- Conference title:
- ESREF04
- Venue:
- Zürich
- Year of conference:
- 2004
- Date of conference beginning:
- 04.10.2004
- Date of conference ending:
- 08.10.2004
- Year:
- 2004
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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