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- Authors:
- Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress
- Title of conference publication:
- 2005 PhD Research in Microelectronics and Electronics
- Conference title:
- Research in Microelectronics and Electronics (2005, Lausanna)
- Conference title:
- PRIME 2005
- Venue:
- Lausanne
- Year of conference:
- 2005
- Date of conference beginning:
- 25.07.2005
- Date of conference ending:
- 28.07.2005
- Year:
- 2005
- Pages from - to:
- 213-216
- Language:
- Englisch
- ISBN:
- 0-7803-9345-7
- DOI:
- 10.1109/RME.2005.1543042
- URL:
- https://doi.org/10.1109/RME.2005.1543042
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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