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Document type:
Konferenzbeitrag / Conference Paper
Title:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices
Title of conference publication:
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)
Subtitle of conference publication:
Arcachon France: 10.10.2005 - 14.10.2005
Conference title:
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (2005, Arcachon)
Venue:
Arcachon, France
Year of conference:
2005
Date of conference beginning:
10.10.2005
Date of conference ending:
14.10.2005
Year:
2005
Language:
Englisch
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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