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- Authors:
- Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Chip-Level Verification of Complex Mixed-Signal ICs regarding ESD-Stress
- Title of conference publication:
- 5th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO)
- Subtitle of conference publication:
- München, 28.-30.11. 2005
- Conference title:
- International Workshop on Electromagnetic Compatibility of Integrated Circuits (5., 2005, München)
- Venue:
- München
- Year of conference:
- 2005
- Date of conference beginning:
- 28.11.2005
- Date of conference ending:
- 30.11.2005
- Year:
- 2005
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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