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Authors:
Rudan, Masssimo; Reggiani, Susanna; Gnani, Elena; Baccarani, Giorgio; Corvasce, Chiara; Barlini, Davide; Ciappa, Mauro; Fichtner, Wolfgang; Denison, Marie; Jensen, Nils; Groos, Gerhard; Stecher, Matthias
Document type:
Konferenzbeitrag / Conference Paper
Title:
Experimental validation of a new analytical model for the position-dependent Hall voltage in semiconductor devices
Title of conference publication:
Proceedings of 35th European Solid-State Device Research Conference, 2005
Subtitle of conference publication:
ESSDERC 2005
Conference title:
European Solid-State Device Research Conference (35., 2005, Grenoble)
Conference title:
35th ESSDERC
Venue:
Grenoble, France
Year of conference:
2005
Date of conference beginning:
16.09.2005
Place of publication:
Piscataway
Publisher:
IEEE
Year:
2005
Pages from - to:
565-568
Language:
Englisch
ISBN:
0-7803-9203-5
ISSN:
1930-8876 ; 2378-6558
DOI:
10.1109/ESSDER.2005.1546711
URL:
https://doi.org/10.1109/ESSDER.2005.1546711
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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