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- Authors:
- Groos, Gerhard
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Characterisation method for chip card ESD events causing terminal failures
- Title of conference publication:
- 23rd European Symposium on Reliability of Electronic Devices, Failure Physics and Analysis (ESREF) 2012
- Subtitle of conference publication:
- 1-5 October 2012: Cagliari, Italy
- Conference title:
- European Symposium on Reliability of Electronic Devices, Failure Physics and Analysis (23., 2012, Cagliari)
- Venue:
- Cagliari, Italy
- Year of conference:
- 2012
- Date of conference beginning:
- 01.10.2012
- Date of conference ending:
- 05.10.2012
- Year:
- 2012
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Groos, Gerhard
- Open Access yes or no?:
- Nein / No
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