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Authors:
Sauter, Martin
Document type:
Zeitschriftenartikel / Journal Article
Title:
Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements
Journal:
Microelectronics Reliability
Volume:
45
Issue:
7-8
Year:
2005
Pages from - to:
1187-1193
Language:
Englisch
DOI:
10.1016/j.microrel.2004.12.003
URL:
https://doi.org/10.1016/j.microrel.2004.12.003
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Sauter, Martin
Open Access yes or no?:
Nein / No
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