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- Authors:
- Sauter, Martin; Pieper, Klaus-Willi
- Document type:
- Zeitschriftenartikel / Journal Article
- Title:
- Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents
- Journal:
- Microelectronics Reliability
- Volume:
- 41
- Issue:
- 1
- Year:
- 2001
- Pages from - to:
- 133-136
- Language:
- Englisch
- DOI:
- 10.1016/S0026-2714(00)00221-3
- URL:
- https://doi.org/10.1016/S0026-2714(00)00221-3
- Department:
- Fakultät für Elektrotechnik und Technische Informatik
- Institute:
- ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
- Chair:
- Sauter, Martin
- Open Access yes or no?:
- Nein / No
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