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- Authors:
- Russ, Christian C.; Ammer, Michael; Esmark, Kai
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Predicting system level ESD robustness using a comprehensive modelling approach
- Title of conference publication:
- Electrical Overstress/Electrostatic Discharge Symposium Proceedings
- Conference title:
- Annual Electrical Overstress/Electrostatic Discharge Symposium (40., 2018, Reno)
- Venue:
- Reno
- Year of conference:
- 2018
- Date of conference beginning:
- 23.09.2018
- Date of conference ending:
- 28.09.2018
- Year:
- 2018
- Language:
- Englisch
- ISBN:
- 1585373028
- Department:
- Fakultät für Elektrotechnik und Informationstechnik
- Institute:
- EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
- Chair:
- Maurer, Linus
- Open Access yes or no?:
- Nein / No
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