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Authors:
Uedono, Akira; Tanaka, Taketoshi; Ito, Norikazu; Nakahara, Ken; Egger, Werner; Hugenschmidt, Christoph P.; Ishibashi, Shoji; Sumiya, Masatomo 
Document type:
Zeitschriftenartikel / Journal Article 
Title:
Vacancy-Type Defects and Their Carrier Trapping Properties in GaN Studied by Monoenergetic Positron Beams 
Journal:
ECS Transactions 
Volume:
86 
Issue:
10 
Year:
2018 
Pages from - to:
149-160 
Language:
Englisch 
ISSN:
1938-6737 
Department:
Fakultät für Luft- und Raumfahrttechnik 
Institute:
LRT 2 - Institut für Angewandte Physik und Messtechnik 
Chair:
Dollinger, Günther 
Open Access yes or no?:
Nein / No