Current automotive megatrends electro mobility, digitalization and autonomous driving lead to more demanding reliability requirements for automotive semiconductors. The most significant change applies to the operating time, which increases at least by a factor four. In this work, a typical new mission profile is used to highlight that the established qualification procedure using standardized stress test conditions, the AEC-Q100, is not sufficient to proof fulfillment of these new life-cycle requirements. Different solutions to extend the existing standard to cover the new requirements are discussed. Those are extended test conditions, Robustness Validation and standardized extended lifetime requirements (SELR). Extended test conditions will preserve the transparency of the existing standard. But they bear the risk that significant efforts are necessary to meet the standard, which does not necessarily reflect the demanded reliability requirements. Robustness Validation results in an application specific reliability assessment. This detailed and highly flexible method causes high efforts to obtain the relevant reliability data on supplier side and to assess it on customer side. The proposed new concept of SELR combines the broad usability of standardized methods with the flexibility of Robustness Validation. It is therefore a promising method to cover future challenges in the validation and qualification of future automotive semiconductor technologies.     «

Current automotive megatrends electro mobility, digitalization and autonomous driving lead to more demanding reliability requirements for automotive semiconductors. The most significant change applies to the operating time, which increases at least by a factor four. In this work, a typical new mission profile is used to highlight that the established qualification procedure using standardized stress test conditions, the AEC-Q100, is not sufficient to proof fulfillment of these new life-cycle req...     »