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Document type:
Zeitschriftenartikel / Journal Article
Title:
Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability
Journal:
Microelectronics Reliability
Issue:
100-101
Year:
2019
Language:
Englisch
Keywords:
Automotive electronics ; Mission profile ; Semiconductor reliability ; Interdependent stressors ; Effective stress
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 2 - Institut für Physik
Chair:
Hansch, Walter
Open Access yes or no?:
Ja / Yes
Type of OA license:
CC BY NC ND 4.0
Licence URL:
BibTeX