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Document type:
Zeitschriftenartikel / Journal Article
Title:
Minority Carrier Lifetime Measurements for Contactless Oxidation Process Characterization and Furnace Profiling
Journal:
Materials
Volume:
12
Issue:
1
Year:
2019
Language:
Englisch
Keywords:
lifetime ; high-resistivity ; float zone ; furnace profiling ; oxide characterization
Article ID:
190
DOI:
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 2 - Institut für Physik
Chair:
Eisele, Ignaz
Open Access yes or no?:
Ja / Yes
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