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Authors:
Engelmann, Eugen; Wiest, Florian; Sporea, D.; Stancalie, A.; Garutti, E.; Hansch, Walter 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Investigation of Radiation Hardness of SiPM Exploiting the Effect of Hot Carrier Luminescence 
Conference title:
International Conference on New Developments in Photodetectors (8., 2017, Tours) 
Venue:
Tours 
Year of conference:
2017 
Date of conference beginning:
03.07.2017 
Date of conference ending:
07.07.2017 
Year:
2017 
Language:
Englisch 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 2 - Institut für Physik 
Chair:
Hansch, Walter 
Open Access yes or no?:
Nein / No