Login
Document type:
Dissertation / Thesis
Title:
New approaches to reliability qualification of semiconductor components under varying and progressive stresses
Advisor:
Hansch, Walter, Univ.-Prof. Dr.-Ing.
Referee:
Hansch, Walter, Univ.-Prof. Dr.-Ing. ; Marquardt, Rainer, Univ.-Prof. Dr.-Ing.
Submission date:
14.01.2021
Date oral examination:
28.06.2021
Place of publication:
Göttingen
Publisher:
Cuvillier Verlag
Year:
2021
Pages (Book):
vi, 152
Language:
Englisch
ISBN:
978-3-7369-7520-0 ; 978-3-7369-6520-1
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 2 - Institut für Physik
Chair:
Hansch, Walter
Open Access yes or no?:
Nein / No
Miscellaneous:
Dissertation an der Universität der Bundeswehr München
BibTeX