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Authors:
Kempt, Roman; Lukas, Sebastian; Hartwig, Oliver; Prechtl, Maximilian; Kuc, Agnieszka; Brumme, Thomas; Li, Sha; Neumaier, Daniel; Lemme, Max; Düsberg, Georg; Heine, Thomas 
Document type:
Sonstiges / Other Publication 
Title:
Stacking polymorphism in PtSe2 drastically affects its electromechanical properties 
Year:
2021 
Language:
Englisch 
Keywords:
PtSe2 ; two-dimensional materials ; piezoresistive sensor ; Raman characterization ; stacking disorder ; density-functional theory 
Abstract:
PtSe2 is one of the most promising materials for the next generation of piezoresistive sensors. However, the large-scale synthesis of homogeneous thin films with reproducible electromechanical properties is challenging due to polycrystallinity. We show that stacking phases other than the AA-stacking in the 1T phase become thermodynamically available at elevated temperatures. We show that these can make up a significant fraction in a polycrystalline thin film and discuss methods to characterize t...    »
 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 2 - Institut für Physik 
Chair:
Düsberg, Georg 
Open Access yes or no?:
Ja / Yes 
Miscellaneous:
arXiv preprint arXiv:2112.08062