Wang, Xiaopeng; Xiong, Kuanchen; Li, Lei; Hwang, James C. M.; Jin, Xin; Fabi, Gianluca; Farina, Marco; Hartwig, Oliver; Prechtl, Maximilian; Düsberg, Georg; Göritz, Alexander; Wietstruck, Matthias; Kaynak, Mehmet
Document type:
Konferenzbeitrag / Conference Paper
Title:
Quantitative Scanning Microwave Microscopy of Few-layer Platinum Diselenide
Title of conference publication:
2020 50th European Microwave Conference (EuMC)
Organizer (entity):
IEEE
Conference title:
European Microwave Conference (50., 2020, Utrecht, Netherlands)
Venue:
Utrecht
Year of conference:
2021
Date of conference beginning:
12.01.2021
Date of conference ending:
14.01.2021
Publisher:
IEEE
Year:
2021
Pages from - to:
987-990
Language:
Englisch
Abstract:
PtSe2 is unique among all 2D materials by having simultaneously sizable bandgap, high carrier mobility, and air stability. Moreover, PtSe2 undergoes a semiconductor-semimetal transition when its thickness increases beyond a few atomic layers, which facilitates low-resistance contact. However, there has been a controversy in how abruptly PtSe2 transitions from a semiconductor to a semimetal. In this work, scanning microwave microscopy was used to quantify the conductivity in two PtSe2 layers 1.5-nm-thick and 3-nm-thick, respectively. The resulted conductivity in 3-nm-thick PtSe2 of (1.7 ± 0.2) × 104 S/m is consistent with that reported for bulk PtSe2 , confirming that 3-nm-thick PtSe2 is a semimetal. However, although the conductivity in 1.5-nm-thick PtSe2 appears much lower, it is too close to that of TiN to be reliably quantified. To characterize low conductivity in few-layer semiconductors, the signal-to … «
PtSe2 is unique among all 2D materials by having simultaneously sizable bandgap, high carrier mobility, and air stability. Moreover, PtSe2 undergoes a semiconductor-semimetal transition when its thickness increases beyond a few atomic layers, which facilitates low-resistance contact. However, there has been a controversy in how abruptly PtSe2 transitions from a semiconductor to a semimetal. In this work, scanning microwave microscopy was used to quantify the conductivity in two PtSe2 layers 1.5-... »