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Authors:
Wang, Xiaopeng; Xiong, Kuanchen; Li, Lei; Hwang, James C. M.; Jin, Xin; Fabi, Gianluca; Farina, Marco; Hartwig, Oliver; Prechtl, Maximilian; Düsberg, Georg; Göritz, Alexander; Wietstruck, Matthias; Kaynak, Mehmet 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Quantitative Scanning Microwave Microscopy of Few-layer Platinum Diselenide 
Title of conference publication:
2020 50th European Microwave Conference (EuMC) 
Organizer (entity):
IEEE 
Conference title:
European Microwave Conference (50., 2020, Utrecht, Netherlands) 
Venue:
Utrecht 
Year of conference:
2021 
Date of conference beginning:
12.01.2021 
Date of conference ending:
14.01.2021 
Publisher:
IEEE 
Year:
2021 
Pages from - to:
987-990 
Language:
Englisch 
Abstract:
PtSe2 is unique among all 2D materials by having simultaneously sizable bandgap, high carrier mobility, and air stability. Moreover, PtSe2 undergoes a semiconductor-semimetal transition when its thickness increases beyond a few atomic layers, which facilitates low-resistance contact. However, there has been a controversy in how abruptly PtSe2 transitions from a semiconductor to a semimetal. In this work, scanning microwave microscopy was used to quantify the conductivity in two PtSe2 layers 1.5-...    »
 
ISBN:
978-2-87487-059-0 ; 978-2-87487-058-3 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 2 - Institut für Physik 
Chair:
Düsberg, Georg 
Open Access yes or no?:
Ja / Yes