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Authors:
Alia, Gazmend; Buzo, Andi; Maier-Flaig, Hannes; Pieper, Klaus-Willi; Maurer, Linus; Pelz, Georg
Document type:
Konferenzbeitrag / Conference Paper
Title:
Automatic Parameter Extraction of MOSFET Compact Models using Differential Evolution with Population Prediction (DEpred)
Title of conference publication:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Conference title:
IEEE Electron Devices Technology & Manufacturing Conference (6., 2022, Oita)
Venue:
Oita, Japan
Year of conference:
2022
Date of conference beginning:
06.03.2022
Date of conference ending:
09.03.2022
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year:
2022
Pages from - to:
94-96
Language:
Englisch
ISBN:
978-1-6654-2178-2 ; 978-1-6654-2179-9
DOI:
10.1109/EDTM53872.2022.9798263
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
Chair:
Maurer, Linus
Open Access yes or no?:
Nein / No
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