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Authors:
Huppmann, Marc; Harrant, Manuel; Nirmaier, Thomas; Buzo, Andi; Maurer, Linus; Pelz, Georg 
Document type:
Konferenzbeitrag / Conference Paper 
Title:
Towards Complete State Machine Traversal via Pseudo Transitions in Automated Lab Verification 
Title of conference publication:
2022 IEEE International Test Conference India (ITC India) 
Subtitle of conference publication:
Bangalore, India, 2022 
Conference title:
IEEE International Test Conference India (2022, Bangalore) 
Venue:
Bangalore, India 
Year of conference:
2022 
Date of conference beginning:
24.07.2022 
Date of conference ending:
26.07.2022 
Place of publication:
Piscataway, NJ 
Publisher:
IEEE 
Year:
2022 
Pages from - to:
1-7 
Language:
Englisch 
Abstract:
The complexity of modern automotive smart power devices increases due to their growing amount of functionality. The resulting extensive internal state machine requires more verification time especially in the mixed-signal post-silicon domain, which still relies on manually intensive directed testing. A state transition based methodology is proposed, that automatically finds a verification path through the complete state machine and ensures that each transition, and hence each state, is traversed...    »
 
Department:
Fakultät für Elektrotechnik und Informationstechnik 
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik 
Chair:
Maurer, Linus 
Open Access yes or no?:
Nein / No