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Autorinnen/Autoren:
Steeneken, Peter; Soikkeli, Miika; Arpiainen, Sanna; Rantala, Arto; Jaaniso, Raivo; Pezone, Roberto; Vollebregt, Sten; Lukas, Sebastian; Kataria, Satender; Houmes, Maurits; Álvarez-Diduk, Ruslan; Lee, Kangho; Wasisto, Hutomo Suryo; Anzinger, Sebastian; Fueldner, Marc; Verbiest, Gerard; Alijani, Farbod; Shin, Dong Hoon; Malic, Ermin; van Rijn, Richard; Nevanen, Tarja; Centeno, Alba; Zurutuza, Amaia; van der Zant, Herre; Merkoci, Arben; Duesberg, Georg; Lemme, Max
Dokumenttyp:
Zeitschriftenartikel / Journal Article
Titel:
Towards wafer-scale 2D material sensors
Zeitschrift:
2D Materials
Jahr:
2025
Sprache:
Englisch
Abstract:
The unique properties of two-dimensional (2D) materials bring great promise to improve sensor performance and realise novel sensing principles. However, to enable their high-volume production, wafer-scale processes that allow integration with electronic readout circuits need to be developed. In this perspective, we review recent progress in on-chip 2D material sensors, and compare their performance to the state-of-the-art, with a focus on results achieved in the Graphene Flagship programme....     »
DOI:
10.1088/2053-1583/adac73
URL zum Inhalt:
https://doi.org/10.1088/2053-1583/adac73
Fakultät:
Fakultät für Elektrotechnik und Informationstechnik
Institut:
EIT 2 - Institut für Physik
Professorin/Professor:
Düsberg, Georg
Projekt:
Graphene Flagship Core 3
Open Access:
Ja / Yes
Sonstige Angaben:
Voraufnahme
Volltext-Version:
Accepted Manuscript
OA-Lizenz des Volltexts:
CC BY 4.0
URL zur OA-Lizenz des Volltexts:
https://creativecommons.org/licenses/by/4.0/
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