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Authors:
Steeneken, Peter; Soikkeli, Miika; Arpiainen, Sanna; Rantala, Arto; Jaaniso, Raivo; Pezone, Roberto; Vollebregt, Sten; Lukas, Sebastian; Kataria, Satender; Houmes, Maurits; Álvarez-Diduk, Ruslan; Lee, Kangho; Wasisto, Hutomo Suryo; Anzinger, Sebastian; Fueldner, Marc; Verbiest, Gerard; Alijani, Farbod; Shin, Dong Hoon; Malic, Ermin; van Rijn, Richard; Nevanen, Tarja; Centeno, Alba; Zurutuza, Amaia; van der Zant, Herre; Merkoci, Arben; Duesberg, Georg; Lemme, Max
Document type:
Zeitschriftenartikel / Journal Article
Title:
Towards wafer-scale 2D material sensors
Journal:
2D Materials
Year:
2025
Language:
Englisch
Abstract:
The unique properties of two-dimensional (2D) materials bring great promise to improve sensor performance and realise novel sensing principles. However, to enable their high-volume production, wafer-scale processes that allow integration with electronic readout circuits need to be developed. In this perspective, we review recent progress in on-chip 2D material sensors, and compare their performance to the state-of-the-art, with a focus on results achieved in the Graphene Flagship programme....     »
DOI:
10.1088/2053-1583/adac73
URL:
https://doi.org/10.1088/2053-1583/adac73
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 2 - Institut für Physik
Chair:
Düsberg, Georg
Project:
Graphene Flagship Core 3
Open Access yes or no?:
Ja / Yes
Miscellaneous:
Voraufnahme
Fulltext version:
Accepted Manuscript
Fulltext OA license:
CC BY 4.0
Fulltext OA license URL:
https://creativecommons.org/licenses/by/4.0/
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