Logo
User: Guest  Login

Authors:
Michel, Tobias; Iskra, Peter; Wiest, Florian; Buttler, Werner; Maurer, Linus
Document type:
Konferenzbeitrag / Conference Paper
Title:
Integrated Charge Pump in 180 nm SOI Technology for a Silicon Drift Detector
Conference title:
Austrian Workshop on Microelectronics (33., 2025, Linz)
Conference title:
Austrochip 2025
Venue:
Linz
Year of conference:
2025
Year:
2025
Language:
Englisch
Abstract:
This paper presents a novel biasing method for a silicon drift detector (SDD). The presented integrated circuit in 180nm silicon-on-insulator (SOI) technology generate negative high-voltages for stable operation of a SDD. The integrated circuit uses a Pelliconi charge pump operating at a frequency of 10MHz, so that voltages of up to −70V are generated with a SDD-typical load current of 25μA. The simulations have been done with open source tools. To satisfy the rigid noise requirements of SDD-bas...     »
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
Chair:
Maurer, Linus
Open Access yes or no?:
Nein / No
Miscellaneous:
Voraufnahme
 BibTeX