Nenchev, Vladislav:
A Comprehensive Safety Analysis for Tracking Neural Controllers
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2026

Konferenzbeitrag / Conference Paper

Reggiani, Susanna; Gnani, Elena; Rudan, Massimo; Baccarani, Giogio; Bychikhin, Sergey; Kuzmík, Ján; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Jensen, Nils; Groos, Gerhard; Stecher, Matthias:
A New Numerical and Experimental Analysis Tool for ESD Devices by Means of the Transient Interferometric Technique
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Pawelczak, Dieter:
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Karnehm, Dominic; Neve, Antja:
A Resource-Constrained Polynomial Regression Approach for Voltage Measurement Compression in Electric Vehicle Battery Packs
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Karnehm, Dominic; Sorokina, Nina; Pohlmann, Sebastian; Mashayekh, Ali; Kuder, Manuel; Neve, Antje:
A high performance simulation framework for battery modular multilevel management converter
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Sauter, Martin; Bertagnolli, Emmerich; Knapek, E.; Fröschle, B.; Eisele, Ignaz; Klose, H.:
A lateral bipolar transistor on SOI fabricated by sub 100 nm e-beam lithography
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Pogany, Dionýz; Litzenberger, Martin; Bychikhin, Sergey; Gornik, Erich; Groos, Gerhard; Stecher, Matthias:
A method for extraction of power dissipating sources from interferometric thermal mapping measurements
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Pawelczak, Dieter; Baumann, Andrea; Schmudde, David:
A new Testing Framework for C-Programming Exercises and Online-Assessments
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Sauter, Martin:
A new method for temperature determination of integrated DMOSFETs
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1999
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Bachhuber, M.; Brenner, P.; Sauter, Martin:
A scalable model for lateral pnp Transistors with multiple emitters
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1999

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Böttcher, Jörg:
Abstandssensoren für Industrie und Automobil
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2019
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Karnehm, Dominic; Neve, Antje:
Adaptive Compressing Electric Vehicle Battery Pack Measurements using Polynomial Coding
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, IEEE
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Ammer, Michael; Esmark, Kai; Rupp, Andreas; zur Nieden, Friedrich; Cao, Yiqun; Sauter, Martin; Maurer, Linus:
Advanced Behavior Modeling of ICs for System-ESD Simulation with Destruction Limits in SPICE
2017

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Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert:
Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress
. In: 2005 PhD Research in Microelectronics and Electronics,
2005
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Morgenstern, Haiko; Groos, Gerhard; Schmidt, M.; Köhne, Heiko; John, Werner; Stecher, Matthias; Reichl, Herbert:
Algorithmus zur automatischen Verifikation komplexer Mixed-Signal ICs gegenüber ESD-Belastungen
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Englberger, Ferdinand; Latzel, Thomas; Sotiriadis, Prodromos:
An Autonomous Robot for Embedded Systems and Robotics
, Piscataway
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Yang, Chun; Arizabaleta-Diez, Markel; Weitkemper, Petra; Pany, Thomas:
An Experimental Analysis of Cyclic and Reference Signals of 4G LTE for TOA Estimation and Positioning in Mobile Fading Environments
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Sprang, Florian; Hanschmann, Alexander; Korb, Matthias; Latzel, Thomas:
An Open-Source Multi-Tenant FPGA Framework for Small Cloud-Like Environments
2026

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Haslbeck, Matthias; Böttcher, Jörg; Braml, Thomas:
An Uncertainty Model for Strain Gages Using Monte Carlo Methodology
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23.
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Agbo, Pheobe; Weitkemper, Petra:
Analysis of Different MEC Offloading Scenarios with LEO Satellite in 5G Networks
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, IEEE
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2023
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