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Authors:
Sauter, Martin
Document type:
Konferenzbeitrag / Conference Paper
Title:
A new method for temperature determination of integrated DMOSFETs
Title of conference publication:
29th European Solid-State Device Research Conference
Series volume:
1
Conference title:
European Solid-State Device Research Conference (29., 1999, Leuven)
Venue:
Leuven
Year of conference:
1999
Date of conference beginning:
13.09.1999
Date of conference ending:
15.09.1999
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year:
1999
Pages from - to:
40-543
Language:
Englisch
ISBN:
2-86332-245-1
URL:
https://ieeexplore.ieee.org/document/1505559
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Sauter, Martin
Open Access yes or no?:
Nein / No
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