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Authors:
Huppmann, Marc; Harrant, Manuel; Nirmaier, Thomas; Buzo, Andi; Maurer, Linus; Pelz, Georg
Document type:
Konferenzbeitrag / Conference Paper
Title:
Towards Complete State Machine Traversal via Pseudo Transitions in Automated Lab Verification
Title of conference publication:
2022 IEEE International Test Conference India (ITC India)
Subtitle of conference publication:
Bangalore, India, 2022
Conference title:
IEEE International Test Conference India (2022, Bangalore)
Venue:
Bangalore, India
Year of conference:
2022
Date of conference beginning:
24.07.2022
Date of conference ending:
26.07.2022
Place of publication:
Piscataway, NJ
Publisher:
IEEE
Year:
2022
Pages from - to:
1-7
Language:
Englisch
Abstract:
The complexity of modern automotive smart power devices increases due to their growing amount of functionality. The resulting extensive internal state machine requires more verification time especially in the mixed-signal post-silicon domain, which still relies on manually intensive directed testing. A state transition based methodology is proposed, that automatically finds a verification path through the complete state machine and ensures that each transition, and hence each state, is traversed...     »
DOI:
10.1109/ITCIndia202255192.2022.9854542
Department:
Fakultät für Elektrotechnik und Informationstechnik
Institute:
EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
Chair:
Maurer, Linus
Open Access yes or no?:
Nein / No
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