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- Authors:
- Wicpalek, Christian; Mayer, Thomas; Maurer, Linus; Vollenbruch, Ulrich; Liu, Yue; Springer, Andreas
- Document type:
- Konferenzbeitrag / Conference Paper
- Title:
- Analysis and Measurement of Spurious Emission and Phase Noise Performance of an RF All-Digital Phase Locked Loop using a Frequency Discriminator
- Collection title:
- IEEE/MTT-S International Microwave Symposium, 2007
- Organizer (entity):
- Institute of Electrical and Electronics Engineers
- Conference title:
- IEEE MTT-S International Microwave Symposium (2007, Honolulu, HI)
- Venue:
- Honululu, Hawaii
- Year of conference:
- 2007
- Date of conference beginning:
- 03.06.2007
- Date of conference ending:
- 08.06.2007
- Year:
- 2007
- Pages from - to:
- 2205-2208
- Language:
- Englisch
- Department:
- Fakultät für Elektrotechnik und Informationstechnik
- Institute:
- EIT 4 - Institut für Mikroelektronik und Schaltungstechnik
- Chair:
- Maurer, Linus
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